A recent scientific publication in the European Journal of Materials highlights an interesting application of BIEGLO material in nuclear research.
Researchers from the Research Centre Řež and the Nuclear Research Institute in the Czech Republic used 6 µm PEEK film supplied by BIEGLO GmbH as part of the sample preparation for X-ray diffraction (XRD) analysis of radioactive materials.
The PEEK film was used to securely encapsulate prepared samples during analysis — a demanding environment where material selection and reliable handling are essential.
We are pleased to see BIEGLO materials supporting independent scientific research in such a highly specialized field.
🔗 Publication: X-ray diffraction for characterization of materials in nuclear industry
European Journal of Materials, published July 2026